Wafer map analysis
Spatial failure patterns traced to the tool
How a run goes
The steps this agent takes, in order, and what each one leaves behind.
Pulls probe maps and lot processing history
Classifies wafer maps by spatial signature such as edge, center, scratch and repeating patterns
Clusters the maps and joins clusters to tool routes
Traces each signature to the tools and chambers the affected lots shared
Drafts the finding with the suspect step ranked first
Produces an evidence pack for the process engineer with the wafers and the suspect step
Works in

Snowflake, Databricks, Tableau
What it does
- Classifies wafer maps by spatial signature such as edge, center, scratch and repeating patterns
- Traces each signature to the tools and chambers the affected lots shared
- Produces an evidence pack for the process engineer with the wafers and the suspect step
Connects to
Snowflake
Query and materialize warehouse data with your existing roles.
Databricks
Run notebooks and read lakehouse tables under governance.
Tableau
Surface published views and data sources in a run.
Skills included
- Signature classification
- Tool commonality
Need it to work differently?
Every agent can be changed: the steps it takes, the systems it uses and who approves what.